activities

Surface relaxation of topological insulators: Influence on the electronic structure: N. Fukui, T. Hirahara, T. Shirasawa, T. Takahashi, K. Kobayashi, and S. Hasegawa, Physical Review B 85, (2012) 115426.

Quick measurement of crystal truncation rod profiles in simultaneous multi-wavelength dispersive mode: T. Matsushita, T. Takahashi, T. Shirasawa, E. Arakawa, H. Toyokawa, and H. Tajiri, Journal of Applied Physics 110, (2011) 102209.

The epitaxial crystalline silicon-oxynitride layer on SiC(0001): Formation of an ideal SiC–insulator interface: Hiroshi Tochihara and Tetsuroh Shirasawa, Progress in Surface Science 86, (2011) 295.

Interface of a Bi(001) film on Si(111)-7x7 imaged by surface x-ray diffraction: Tetsuroh Shirasawa, Masanori Ohyama, Wolfgang Voegeli, and Toshio Takahashi, Physical Review B 84, 075411 (2011).

Core Level Photoemission Spectroscopy Study on the Epitaxial SiON Layer formed on the SiC(0001), T. Shirasawa, S. Tanaka, T. Muro, Y. Tamenori, Y. Harada, T. Tokushima, T. Kinoshita, S. Shin, T. Takahashi, and H. Tochihara: Materials Science Forum vols. 675-677, pp 15-19 (2011).

Atomic and valence-band electronic structures of the epitaxial SiON layer on the SiC(0001): X-ray diffraction and angle-resolved photoemission spectroscopy investigations: T. Shirasawa, K. Sakamoto, T. Takahashi and H. Tochihara, Surf. Sci. 605 (2011) 328-332.

Ground state of the Sn/Ge(111)-3×3 surface and its electron-beam-induced disordering: T. Shirasawa, H. Tochihara, K. Kubo, W. Voegeli and T. Takahashi, Phys. Rev. B 81 (2010) 081409(R)(1-4).

Structure of the quasi-one-dimensional Si(553)-Au surface: Gold dimer row and silicon honeycomb chain: W. Voegeli, T. Takayama, T. Shirasawa, M. Abe, K. Kubo, T. Takahashi, K. Akimoto and H. Sugiyama, Phys. Rev. B 82 (2010) 075426(1-6).

Re-investigation of the Bi-induced Si(111)-(√3×√3) surfaces by low-energy electron diffraction: T. Kuzumaki, T. Shirasawa, S. Mizuno, N. Ueno, H. Tochihara and K. Sakamoto, Surf. Sci. 604 (2010) 1044-1048.

原子レベルで急峻な界面構造と電子状態-SiC上の絶縁性SiON超薄膜-, 白澤徹郎，栃原　浩: 日本物理学会誌第65巻, 3号, pp. 191-194 (2010).

Atomic-layer-resolved bandgap structure of an ultrathin oxynitride-silicon film epitaxially grown on 6H-SiC(0001): T. Shirasawa, K. Hayashi, H. Yoshida, S. Mizuno, S. Tanaka, T. Muro, Y. Tamenori, Y. Harada, T. Tokushima, Y. Horikawa, E. Kobayashi, T. Kinoshita, S. Shin, T. Takahashi, Y. Ando, K. Akagi, S. Tsuneyuki and H. Tochihara, Phys. Rev. B 79 (2009) 241301(R)(1-4).

Interface Structure of an Epitaxial Iron Silicide on Si(111) Studied with X-Ray Diffraction: T. Shirasawa, K. Sekiguchi, Y. Iwasawa, W. Voegeli, T. Takahashi, K. Hattori, A. N. Hattori, H. Daimon and Y. Wakabayashi, e-J. Surf. Sci. Nanotech. 7 (2009) 513-517.

Structural Study of the Si(553)-Au Surface: T. Takayama, W. Voegeli, T. Shirasawa, K. Kubo, M. Abe, T. Takahashi, K. Akimoto and H. Sugiyama, e-J. Surf. Sci. Nanotech. 7 (2009) 533-536.

Study of the Interface Structure of Epitaxial Ultra-Thin Film by an X-Ray Holographic Imaging Method: T. Takahashi, T. Shirasawa, K. Sekiguchi and W. Voegeli, e-J. Surf. Sci. Nanotech. 7 (2009) 525-528.

表面Ｘ線回折の最近の動向と位相問題: 田尻寛男, 高橋敏男, 放射光学会誌 22, (2010) 131.

Study of buried Si(111)-5×2-Au by surface X-ray diffraction: Y. Iwasawa, W. Voegeli, T. Shirasawa, K. Sekiguchi, T. Nojima, R. Yoshida, T. Takahashi, M. Matsumoto, T. Okano, K. Akimoto, H. Kawata and H. Sugiyama, Applied Surface Science 254 (2008) 7803-7806.

Surface X-ray Diffraction Study of the Metal-Insulator Transition on the Si(553)-Au Surface: W. Voegeli, T. Takayama, K. Kubo, M. Abe, Y. Iwasawa, T. Shirasawa, T. Takahashi, K. Akimoto, H. Sugiyama, H. Tajiri and O. Sakata, e-J. Surf. Sci. Nanotech. 6 (2008) 281-285.

SiC上の結晶化SiON超薄膜, 白澤徹郎, 水野清義, 栃原浩, 田中悟: 固体物理, 第43巻, 第4号, pp. 231-237, (2008).

Structural study of Si(111)-6×1-Ag surface using surface x-ray diffraction: K. Sumitani, K. Masuzawa, T. Hoshino, R. Yoshida, S. Nakatani, T. Takahashi, H. Tajiri, K. Akimoto, H. Sugiyama, X. Zhang and H. Kawata, Surf. Sci. 601 (2007) 5195-5199.

Structure of the oxidized 4H-SiC(0001)-3×3 surface: W. Voegeli, K. Akimoto, T. Urata, S. Nakatani, K. Sumitani, T. Takahashi, Y. Hisada, Y. Mitsuoka, S. Mukainakano, H. Sugiyama, X. Zhang and H. Kawata, Surf. Sci. 601 (2007) 1048-1053.

High Sensitive Imaging of Atomic Arrangement of Ge Clusters Buried in a Si Crystal by X-ray Fluorescence Holography: S. Kusano, S. Nakatani, K. Sumitani, T. Takahashi, Y. Yoda, N. Usami and Y. Shiraki, Jpn. J. Appl. Phys. 45 (2006) 5248-5253.

Study of the surface structure of Si(111)-6×1(3×1)-Ag using x-ray crystal truncation rod scattering: K. Sumitani, K. Masuzwa, T. Hoshino, S. Naktani, T. Takahashi, H. Tajiri, A. Koichi, H. Sugiyama, X. Zhang and H. Kawata, Appl. Surf. Sci. 252 (2006) 5288-5291.

Structure of the SiC (0001) 3×3 reconstruction studied by surface X-ray diffraction: W. Voegeli, K. Akimoto, T. Aoyama, K. Sumitani, S. Nakatani, H. Tajiri, T. Takahashi, Y. Hisada, S. Mukainakano and X. Zhang, Applied Surface Science 252 (2006) 5259-5262.

Crystallization process of high-k gate dielectrics studied by surface X-ray diffraction: N. Terasawa, K. Akimoto, Y. Mizuno, A. Ichimiya, K. Sumitani, T. Takahashi, X. W. Zhang, H. Sugiyama, H. Kawata, T. Nabatame and A. Toriumi, Appl. Surf. Sci. 244 (2005) 16-20.

Disordered structure of Pt(111)-p(2×2) induced by synchrotron X-ray beam irradiation: M. Nakamura, K. Sumitani, M. Ito, T. Takahashi and O. Sakata, Surf. Sci. 563 (2004) 199-205.

New method to characterize mezoscopic range and very small strain with using multi-wave x-ray diffraction: W. Yashiro, K. Sumitani, T. Takahashi, Y. Yoda and K. Miki, Surf. Sci. 550 (2004) 93-105.

Sample holder assembly covering a wide range of temperatures for surface X-ray diffraction: H. Tajiri, K. Sumitani, S. Nakatani, T. Takahashi, K. Akimoto, H. Sugiyama, X. Zhang and H. Kawata, Appl. Surf. Sci. 237 (2004) 645-648.

Structure of the Si(113) surface studied by surface X-ray diffraction: Y. Mizuno, K. Akimoto, T. Aoyama, H. Suzuki, H. Nakahara, A. Ichimiya, K. Sumitani, T. Takahashi, X. W. Zhang, H. Sugiyama and H. Kawata, Appl. Surf. Sci. 237 (2004) 40-44.

Surface X-ray diffraction in transmision geometry: H. Tajiri, O. Sakatani and T. Takahashi, Appl. Surf. Sci. 234 (2004) 403-408.

X-ray diffraction study of the Si(111)-3×3-Ag surface structure: H. Tajiri, K. Sumitani, S. Nakatani, A. Nojima, T. Takahashi, K. Akimoto, H. Sugiyama, X. Zhang and H. Kawata, Phys. Rev. B 68 (2003) 035330(1-5).

A phase retrieval method for noncrystalline layers on crystal surfaces: W. Yashiro, K. Sumitani, Y. Yoda and T. Takahashi, Jpn. J. Appl. Phys. 42 (2003) 6658-6662.

Characterization of amorphous-Si/1ML-Ge/Si(001) Interface Structure by X-ray Standing Waves: S. Nakatani, K. Sumitani, A. Nojima, T. Takahashi, K. Hirano, S. Koh, T. Irisawa and Y. Shiraki, Jpn. J. Appl. Phys. 42 (2003) 7050-7052.

Study on Sublattice Reversal in a GaAs/Ge/GaAs(001) Crystal by X-Ray Standing Waves: S. Kusano, S. Nakatani, T. Takahashi, K. Hirano, S. Koh, M. Ebihara, T. Kondo and R. Ito, Jpn. J. Appl. Phys. 42 (2003) 2582-2586.

Three-Dimensional Reconstruction of Atoms in Surface X-Ray Diffraction: K. Sumitani, T. Takahashi, S. Nakatani, A. Nojima, O. Sakata, Y. Yoda, S. Koh, T. Irisawa and Y. Shiraki, Jpn. J. Appl. Phys. 42 (2003) L189-L191.

Structural study of SiC(0001)3x3 surface by surface X-ray diffraction: T. Aoyama, K. Akimoto, A. Ichimiya, Y. Hisada, S. Mukainakano, T. Emoto, H. Tajiri, T. Takahashi, H. Sugiyama, X. Zhang and H. Kawata, Appl. Surf. Sci. 216 (2003) 356-360.

Crystal orientation of silver films on silicon surface revealed by surface X-ray diffraction: A. Hata, K. Akimoto, S. Horii, T. Emoto, A. Ichimiya, H. Tajiri, T. Takahashi, H. Sugiyama, X. Zhang and H. Kawata, Surf. Rev. Lett. 10 (2003) 431-434.

X-ray diffraction study of the phase transition of Si(111)√3×√3-Ag surface: T. Takahashi, H. Tajiri, K. Sumitani, K. Akimoto, H. Sugiyama, X. Zhang and H. Kawata, Surf. Rev. Lett. 10 (2003) 519-524.

Electronic properties of single-crystal alpha-Al2O3 films on Ru(0001): K. Nagata, C. Yamada, T. Takahashi and Y. Murata, Phys. Condens. Mat. 15 (2003) 8165-8176.

Beamline for surface and interface structures at SPring-8: O. Sakata, Y. Furukawa, S. Goto, T. Mochizuki, T. Uruga, K. Takeshita, H. Ohashi, T. Ohata, T. Matsushita, S. Takahashi, H. Tajiri, T. Ishikawa, M. Nakamura, M. Ito, K. Sumitani, T. Takahashi, T. Shimura, A. Saito and M. Takahasi, Surf. Rev. Lett 10 (2003) 543-547.

Direct phase measurement of the x-ray specular reflection using modulation under the Bragg condition: W. Yashiro, K. Shimizu, K. Hirano and T. Takahashi, Jpn. J. Appl. Phys. 41 (2002) L592-L594.

Debye-Waller factors of Si(111)√3×√3-Ag: T. Takahashi, H. Tajiri, K. Sumitani and S. Nakatani, Acta Cryst. A58(Supple) (2002) C371.

Surface and interface structure beamline (BL13XU): O. Sakata, Y. Furukawa, S. Goto, T. Mochizuki, T. Uruga, K. Takeshita, H. Ohashi, T. Ohta, T. Matsushita, S. Takahashi, T. Ishikawa, K. Sumitani, T. Takahashi, M. Nakamura, M. Ito, A. Saito, T. Shimura and M. Takahasi, Acta Cryst. A58(Supple) (2002) C162.

Surface X-ray diffraction study of Cu UPD on Au(111) electrode in 0.5M H2SO4 solution: M. Ito, M. Nakamura, Y. Yoda, O. Sakata and T. Takahashi, Acta Cryst. A58(Supple) (2002) C346.

Study of the Si(111)"5×5"-Cu Surface Structure by X-Ray Diffraction and Scanning Tunneling Microscopy: S. Nakatani, Y. Kuwahara, H. Kuramochi, T. Takahashi and M. Aono, Jpn. J. Appl. Phys. 40 (2001) L695-L697.

Dawrin''s theory for the grazing incidence geometry: W. Yashiro, Y. Itoh, M. Takahasi and T. Takahashi, Surf. Sci. 490 (2001) 394-408.

Holographic imaging of surface atoms using surface X-ray diffraction: T. Takahashi, K. Sumitani and S. Kusano, Surf. Sci. 493 (2001) 36-41.

Interface structure of Ag/Si(111) revealed by X-ray diffraction: S. Horii, K. Akimoto, S. Ito, T. Emoto, A. Ichimiya, H. Tajiri, W. Yashiro, S. Nakatani, T. Takahashi, H. Sugiyama, X. Zhang and H. Kawata, Surf. Sci. 493 (2001) 194-199.

Structural study of Si(111) √21×√21-(Ag+Au) surface by X-ray diffraction: H. Tajiri, K. Sumitani, W. Yashiro, S. Nakatani, T. Takahashi, K. Akimoto, H. Sugiyama, X. Zhang and H. Kawata, Surf. Sci. 493 (2001) 214-220.

Effect of surface structure on crystal-truncation-rod scattering under the Bragg condition: T. Takahashi, W. Yashiro, M. Takahasi, S. Kusano, X. Zhang and M. Ando, Phys. Rev. B 62 (2000) 3630-3638.

Ultra-small-angle neutron scattering studies on phase separation of poly (vinyl alcohol) gels: H. Takeshita, T. Kanaya, K. Nishida, K. Kaji, T. Takahashi and M. Hashimoto, Phys. Rev. E 61 (2000) 2125-2128.

The significant information for colloidal crystal formation revealed by ultra-small-angle synchrotron X-ray and neutron Scattering: T. Harada, H. Matsuoka, T. Ikeda, H. Yamaoka, N. Hamaya, S. Sasaki, T. Mori, M. Hashimoto and T. Takahashi, Colloids and Surfaces A: Physicochemical and Engineering Aspects 174 (2000) 99.

X-ray diffraction from an atomic plane: W. Yashiro and T. Takahashi, Acta Cryst. A 56 (2000) 163-167.

Study of sublattice inversion in GaAs/Ge/GaAs(001) crystal by x-ray diffraction: S. Nakatani, S. Kusano, T. Takahashi, K. Hirano, S. Koh, T. Kondo and R. Ito, Appl. Surf. Sci. 159/160 (2000) 256.

Measurement of transverse coherent separation of spin precessing neutron using spin splitters: M. Hino, T. Ebisawa, S. Tasaki, Y. Otake, H. Tabata, M. Hashimoto, T. Takahashi and N. Achiwa, J. Phys. Chem. Sol. 60 (1999) 1603.

On neutron scattering appearing in the tail of the rocking curve of channel-cut crystal: M. Hashimoto and T. Takahashi, J. Phys. Chem. Sol. 60 (1999) 1595.

Ultra small angle neutron scattering instrument at C1-3 in JRR-3M: T. Takahashi, M. Hashimoto and S. Nakatani, J. Phys. Chem. Sol. 60 (1999) 1591.

Normal-incidence x-ray standing-wave analysis of Si(111)√3×√3-Au structure: A. Saito, K. Izumi, T. Takahashi and S. Kikuta, Phys. Rev. B 58 (1998) 3541-3544.

Ultra-small-angle neutron scattering study of colloidal alloys. 1. Contrast variation experiments for mixtures of hydrogenated and deuterated polystyrene lattices in H2O/D2O: H. Matsuoka, T. Ikeda, H. Yamaoka, M. Hashimoto, T. Takahashi, M. M. Agamalian and G. D. Wignall, Langmuir 15 (1998) 293.

Neutron Polarization Control by Interferometer: S. Nakatani, T. Takahashi, H. Tomimitsu and S. Kikuta, J. Phys. Soc. Jpn. 65 Suppl. A (1996) 77.

New Aspects of Dynamical Diffraction Phenomena of Neutrons: T. Takahashi, J. Phys. Soc. Jpn. 65 Suppl. A (1996) 271.

X-Ray Diffraction Study on Si Surfaces: M. Takahasi and T. Takahashi, in: Proceedings of the Oji Seminar on Chemical Processes at Surfaces based on Atomic Scale Structure and Dynamics, edited by K. Tannaka (WORDS Pub., 1996), 95-101.

Structure determination of Si(111)√3×√3-Sb surface by X-ray diffraction: S. Nakatani, Y. Kuwahara, T. Takahashi and M. Aono, Surf. Sci. 357/358 (1996) 65.

Study of the Si(001) clean surface structure using a six-circle surface x-ray diffractometer: M. Takahasi, S. Nakatani, Y. Ito, T. Takahashi, X. W. Zhang and M. Ando, Surf. Sci. 357/358 (1996) 78.

X-ray reflectivity for the complete determination of surface structures: T. Takahashi and S. Nakatani, Surf. Sci. 357/358 (1996) 69.